测试平台cq9电子微于2004年导入测试代工服务，平台由Adventest平台为主轴，提供存储器测试服务，知足客户端最终测试需求。
| Tester | Capability Index | Configuration | Picture |
| Advantest T5832 | Test Data Rate | 1.2 Gbps |
|
| Digital Channels | 11264 | ||
| DPS | 1152 | ||
| PEM | 32 | ||
| PSM144 | 8 | ||
| Max DUT | 512 |
| Tester | Capability Index | Configuration | Picture |
Teradyne | Test Data Rate | 1.2 Gbps |
|
| Digital Channels | 8192 | ||
| DPS/HV Channels | 2048/2048 | ||
| HSB3 | 16(2 chassis*8 HSB3) | ||
| UPB 2.1 | 128(VU only) | ||
| TIU | 8192CH | ||
| UI Ver | H6.23.2.1 | ||
| Max DUT | 512 |
| Tester | Capability Index | Configuration | Picture |
| Advantest T5585 | Test Data Rate | 500 MHz |
|
| Digital Channels | 2688 | ||
| DPS | 192 | ||
| PEM | 36 | ||
| DC unit | 64 | ||
| Max DUT | 128 |
| Tester | Capability Index | Configuration | Picture |
| Advantest T5593 | Test Data Rate | 1.066GHz |  |
| Digital Channels | 3072 | ||
| DPS | 320 | ||
| PEM | 64 | ||
| DC unit | 64 | ||
| Max DUT | 128 |
| Tester | Capability Index | Configuration | Picture |
| Advantest T5581 | Test Data Rate | 250 MHz |
|
| Digital Channels | 1600 | ||
| DPS | 64 | ||
| PEM | 96 | ||
| DC unit | 32 | ||
| Max DUT | 64 |
Process | Capability Index | Configuration | Picture |
Burn In
| Slot | 48(24 x 2 chambers) |
|
Test period | 100ns to 1.2ms | ||
Temp. range | -10~150 deg.C | ||
DPS | 4V40AX2,15V3AX2 | ||
Signal resource | DR 100 ch, I/O 72 ch | ||
Option | Extend DPS (VS P4V20AX2) | ||
DPM | 16G |
| Tester | Capability Index | Configuration | Picture |
| Diamond X Tester | Test Data Rate | 100MHz |  |
| I/O channels | 96 channels / board | ||
| DPIN96 | 12 | ||
| Max DUT | 256 |
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